Tuesday, 1 November 2016

Canberra, Sydney and on to Melbourne. RF Testing at Wafer level


Canberra

Couldn’t get over how spread out and apparently quiet Canberra is. Yes, it has the public buildings, parliament, museums etc  but most of it feels distinctly suburban. After two nights in Sydney, arrived in Melbourne  to find that November 1st is Melbourne Cup  Day and almost everyone is dressed up to the nines and heading off to the races. I watched it on the big screen in Federation Square. 

Canberra: Swan on the Lake

Canberra: Parliament House

Canberra: National Museum of Australia

Canberra: National Museum of Australia

Canberra: National Museum of Australia

National Museum of Australia A History of the World in 100 Objects
Object 20  
Ramses II, Temple of Khum c.1280 BCE


A History of the World in 100 Objects
Object 101 Wireless LAN test and measurement System
RF gets in somewhere! 

More RF!
Canberra Deep Space Communication Complex:
Dish DSS
-43 (70-metre)

 Deep Space Station 46 (DSS-46).
Now decommissioned, it was originally located at the Honeysuckle Creek Tracking Station and 
is famous for being the antenna which received and relayed the first TV images of Neil Armstrong making that one small step on the Moon in 1969



No connection to RF.
Paterson's curse is a pretty, innocent looking, flower invading Australia's grasslands
Cooma cottage in Yass, near Canberra 


Queen Victoria in front of her building in Sydney

Queen Victoria Building in Sydney
And now for RF Testing at Wafer level 
Why?
          Often needed during development
          Eg to measure TSV performance or integrated passive components
          Move to advanced packaging solutions, eg WLCSP, has meant that measurements that could previously be done at final package test are now needed at wafer level
          Wafer and die testing using a probe station  is fairly straightforward at low frequencies
          Not so easy at MHz and above


Cannot use conventional probes at > Mhz frequencies